10x10mm M-jirgin saman Aluminum Substrate

Takaitaccen Bayani:

10x10mm M-jirgin saman Aluminum Substrate- Mafi dacewa don aikace-aikacen optoelectronic na ci gaba, yana ba da ingantaccen ingancin crystalline da kwanciyar hankali a cikin ƙaramin tsari, ingantaccen tsari.


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Semicera's10x10mm M-jirgin saman Aluminum Substratean ƙera shi sosai don biyan madaidaitan buƙatun ci-gaba na aikace-aikacen optoelectronic. Wannan madaidaicin yana fasalta daidaitawar jirgin sama na M-jirgin da ba na polar ba, wanda ke da mahimmanci don rage tasirin polarization a cikin na'urori kamar LEDs da diodes na laser, wanda ke haifar da haɓaka aiki da inganci.

The10x10mm M-jirgin saman Aluminum Substratean ƙera shi da ingantaccen ingancin crystalline, yana tabbatar da ƙarancin ƙarancin lahani da ingantaccen tsarin tsari. Wannan ya sa ya zama kyakkyawan zaɓi don haɓakar epitaxial na manyan fina-finai na III-nitride, waɗanda ke da mahimmanci don haɓaka na'urorin optoelectronic na gaba.

Madaidaicin aikin injiniya na Semicera yana tabbatar da cewa kowane10x10mm M-jirgin saman Aluminum Substrateyana ba da daidaiton kauri da shimfidar ƙasa, waɗanda ke da mahimmanci don jigilar fim iri ɗaya da ƙirƙira na'urar. Bugu da ƙari, ƙaƙƙarfan girman substrate yana sa ya dace da bincike da yanayin samarwa, yana ba da damar yin amfani da sassauƙa a aikace-aikace iri-iri. Tare da kyakkyawan yanayin zafi da kwanciyar hankali na sinadarai, wannan yanki yana ba da ingantaccen tushe don haɓaka fasahar fasahar optoelectronic.

Abubuwa

Production

Bincike

Dummy

Crystal Parameters

Polytype

4H

Kuskuren daidaita yanayin saman

<11-20>4±0.15°

Ma'aunin Wutar Lantarki

Dopant

n-nau'in Nitrogen

Resistivity

0.015-0.025ohm · cm

Ma'aunin injina

Diamita

150.0 ± 0.2mm

Kauri

350± 25 μm

Matsakaicin firamare

[1-100]±5°

Tsawon lebur na farko

47.5 ± 1.5mm

Filayen sakandare

Babu

TTV

≤5m ku

≤10 μm

≤15 μm

LTV

≤3 μm (5mm*5mm)

≤5 μm (5mm*5mm)

≤10 μm (5mm*5mm)

Ruku'u

- 15 μm ~ 15 μm

- 35 μm ~ 35 μm

-45μm ~ 45μm

Warp

≤35 μm

≤45 μm

≤55 μm

Gaba (Si-face) rashin ƙarfi (AFM)

Ra≤0.2nm (5μm*5μm)

Tsarin

Yawan bututu

<1 ya/cm2

<10 a/cm2

<15 ku/cm2

Karfe najasa

≤5E10atoms/cm2

NA

BPD

≤1500 ea/cm2

≤3000 ea/cm2

NA

TSD

≤500 ea/cm2

≤1000 ea/cm2

NA

Ingancin Gaba

Gaba

Si

Ƙarshen saman

Farashin CMP

Barbashi

≤60ea/wafer (size≥0.3μm)

NA

Scratches

≤5ea/mm. Tarin tsayin ≤ Diamita

Tsawon tsayi≤2*Diamita

NA

Bawon lemu/ramuka/tabo/tabo/ fasa/kamuwa

Babu

NA

Gefen kwakwalwan kwamfuta / indents / karaya / hex faranti

Babu

Yankunan polytype

Babu

Tarin yanki≤20%

Tarin yanki≤30%

Alamar Laser ta gaba

Babu

Kyakkyawan Baya

Baya gamawa

C-face CMP

Scratches

≤5ea/mm, Tsawon tarawa≤2* Diamita

NA

Lalacewar baya (guntuwar baki/indents)

Babu

Baƙar fata

Ra≤0.2nm (5μm*5μm)

Alamar Laser na baya

1 mm (daga saman gefen)

Gefen

Gefen

Chamfer

Marufi

Marufi

Epi- shirye tare da marufi

Marufin kaset mai yawa-wafer

* Bayanan kula: "NA" yana nufin babu buƙatar Abubuwan da ba a ambata ba suna iya komawa zuwa SEMI-STD.

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SiC wafers

  • Na baya:
  • Na gaba: